CEM researchers Jay Gupta and Donghun Lee have published an article titled “Tunable Field-Control over the Binding Energy of Single Dopants by a Charged Vacancy in GaAs” in Science Magazine explaining how tiny defects inside a computer chip can be used to tune the properties of key atoms in the chip.
Though the technique is currently limited to the laboratory, it could prove valuable to industry in the future, as the continued miniaturization of cell phone and computer chips makes the performance of individual atoms in a semiconductor more important.
Full text available at the Science Magazine website.
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