MSE Colloquium: Dr. Jinwoo Hwang- “Advancing Scanning Transmission Electron Microscopy for Materials Characterization”

When:
April 9, 2014 @ 8:10 pm – 9:10 pm
2014-04-09T20:10:00+00:00
2014-04-09T21:10:00+00:00
Where:
264 MacQuigg

MSE Colloquium

Dr. Jinwoo Hwang, University of California, Santa Barbara

“Advancing Scanning Transmission Electron Microscopy for Materials Characterization”

Abstract

Development of new multi-scale characterization tools and techniques is critical for the design and synthesis of future materials.  Within the last decade, instrumentation for (scanning) transmission electron microscopy (S/TEM) has made tremendous progress.  The next phase is to utilize these advances to solve the eminent materials problems of today.  This requires the development of S/TEM techniques that can achieve, for example, atomic scale 3D information, variable resolution, high precision, and atomic scale analysis of non-crystalline or soft materials, including biological systems.  I will present recent advances in developing novel S/TEM techniques that allow for understanding the structural origins of materials functionality and dynamics from atomic to meso scale, in several representative materials systems.  These new techniques include quantitative S/TEM for atomic scale 3D imaging of dopants, position averaged convergent beam electron diffraction for functional oxides, and electron nanodiffraction and fluctuation microscopy for non-crystalline and soft materials.  Combined with in-situ conditions, and data prediction, and analysis based on advanced computational simulations, these novel techniques provide powerful tools for the structural determination of future materials beyond current limitations.

Bio

Jinwoo Hwang received his Ph.D. from the University of Wisconsin, Madison in 2011.  He is currently a postdoctoral researcher at the University of California, Santa Barbara.  His research interests include advanced structural characterization of materials, S/TEM technique development, and computational materials modeling.  In particular, he has developed novel S/TEM techniques and simulation methods based on electron nanodiffraction and quantitative imaging, for nanostructured materials, oxide heterostructures, and non-crystalline materials.  For his contributions to the field, he has received several honors and awards, including a best postdoctoral paper award from the Microscopy and Microanalysis Society in 2013.